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Yue, Xiaoqi, Malmberg, Per, Isotahdon, Elisa, Ratia-Hanby, Vilma, Huttunen-Saarivirta, Elina, Leygraf, Christofer, Pan, Jinshan (2023) Penetration of corrosive species into copper exposed to simulated O2-free groundwater by time-of-flight secondary ion mass spectrometry (ToF-SIMS) Corrosion Science, 210. 110833 doi:10.1016/j.corsci.2022.110833

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Reference TypeJournal (article/letter/editorial)
TitlePenetration of corrosive species into copper exposed to simulated O2-free groundwater by time-of-flight secondary ion mass spectrometry (ToF-SIMS)
JournalCorrosion Science
AuthorsYue, XiaoqiAuthor
Malmberg, PerAuthor
Isotahdon, ElisaAuthor
Ratia-Hanby, VilmaAuthor
Huttunen-Saarivirta, ElinaAuthor
Leygraf, ChristoferAuthor
Pan, JinshanAuthor
Year2023 (January)Volume210
PublisherElsevier BV
DOIdoi:10.1016/j.corsci.2022.110833Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID15513207Long-form Identifiermindat:1:5:15513207:0
GUID0
Full ReferenceYue, Xiaoqi, Malmberg, Per, Isotahdon, Elisa, Ratia-Hanby, Vilma, Huttunen-Saarivirta, Elina, Leygraf, Christofer, Pan, Jinshan (2023) Penetration of corrosive species into copper exposed to simulated O2-free groundwater by time-of-flight secondary ion mass spectrometry (ToF-SIMS) Corrosion Science, 210. 110833 doi:10.1016/j.corsci.2022.110833
Plain TextYue, Xiaoqi, Malmberg, Per, Isotahdon, Elisa, Ratia-Hanby, Vilma, Huttunen-Saarivirta, Elina, Leygraf, Christofer, Pan, Jinshan (2023) Penetration of corrosive species into copper exposed to simulated O2-free groundwater by time-of-flight secondary ion mass spectrometry (ToF-SIMS) Corrosion Science, 210. 110833 doi:10.1016/j.corsci.2022.110833
In(2023) Corrosion Science Vol. 210. Elsevier BV


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