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Astakhov, Oleksandr, Carius, Reinhard, Finger, Friedhelm, Petrusenko, Yuri, Borysenko, Valery, Barankov, Dmytro (2009) Relationship between defect density and charge carrier transport in amorphous and microcrystalline silicon. Physical Review B, 79 (10) doi:10.1103/physrevb.79.104205

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Reference TypeJournal (article/letter/editorial)
TitleRelationship between defect density and charge carrier transport in amorphous and microcrystalline silicon
JournalPhysical Review B
AuthorsAstakhov, OleksandrAuthor
Carius, ReinhardAuthor
Finger, FriedhelmAuthor
Petrusenko, YuriAuthor
Borysenko, ValeryAuthor
Barankov, DmytroAuthor
Year2009 (March 18)Volume79
Issue10
PublisherAmerican Physical Society (APS)
DOIdoi:10.1103/physrevb.79.104205Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID14200219Long-form Identifiermindat:1:5:14200219:5
GUID0
Full ReferenceAstakhov, Oleksandr, Carius, Reinhard, Finger, Friedhelm, Petrusenko, Yuri, Borysenko, Valery, Barankov, Dmytro (2009) Relationship between defect density and charge carrier transport in amorphous and microcrystalline silicon. Physical Review B, 79 (10) doi:10.1103/physrevb.79.104205
Plain TextAstakhov, Oleksandr, Carius, Reinhard, Finger, Friedhelm, Petrusenko, Yuri, Borysenko, Valery, Barankov, Dmytro (2009) Relationship between defect density and charge carrier transport in amorphous and microcrystalline silicon. Physical Review B, 79 (10) doi:10.1103/physrevb.79.104205
In(2009, March) Physical Review B Vol. 79 (10) American Physical Society (APS)

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Astakhov, Oleksandr, Finger, Friedhelm, Carius, Reinhard, Lambertz, Andreas, Petrusenko, Yuri, Borysenko, Valery, Barankov, Dmitriy (2006) Electron spin resonance studies of microcrystalline and amorphous silicon irradiated with high energy electrons. Journal of Non-Crystalline Solids, 352 (9) 1020-1023 doi:10.1016/j.jnoncrysol.2006.01.060
Smirnov, Vladimir, Astakhov, Oleksandr, Carius, Reinhard, Petrusenko, Yuri, Borysenko, Valeriy, Finger, Friedhelm (2012) Variation in Absorber Layer Defect Density in Amorphous and Microcrystalline Silicon Thin Film Solar Cells with 2 MeV Electron Bombardment. Japanese Journal of Applied Physics, 51. 22301 doi:10.1143/jjap.51.022301
Smirnov, Vladimir, Astakhov, Oleksandr, Carius, Reinhard, Petrusenko, Yuri, Borysenko, Valeriy, Finger, Friedhelm (2012) Variation in Absorber Layer Defect Density in Amorphous and Microcrystalline Silicon Thin Film Solar Cells with 2 MeV Electron Bombardment. Japanese Journal of Applied Physics, 51 (2) 22301 doi:10.7567/jjap.51.022301
Astakhov, Oleksandr, Smirnov, Vladimir, Carius, Reinhard, Petrusenko, Yuri, Borysenko, Valeriy, Böttler, Wanjiao, Finger, Friedhelm (2012) Variation of the defect density in a-Si:H and μc-Si:H based solar cells with 2MeV electron bombardment. Journal of Non-Crystalline Solids, 358 (17) 2198-2201 doi:10.1016/j.jnoncrysol.2011.12.091
Astakhov, O, Carius, R, Petrusenko, Yu, Borysenko, V, Barankov, D, Finger, F (2012) The relationship between hydrogen and paramagnetic defects in thin film silicon irradiated with 2 MeV electrons. Journal of Physics: Condensed Matter, 24 (30). 305801pp. doi:10.1088/0953-8984/24/30/305801
Klein, Stefan, Finger, Friedhelm, Carius, Reinhard, Dylla, Thorsten, Klomfass, Josef (2007) Relationship between the optical absorption and the density of deep gap states in microcrystalline silicon. Journal of Applied Physics, 102 (10). 103501pp. doi:10.1063/1.2815645
Astakhov, O., Carius, R., Lambertz, A., Petrusenko, Yu., Borysenko, V., Barankov, D., Finger, F. (2008) Structure of the ESR spectra of thin film silicon after electron bombardment. Journal of Non-Crystalline Solids, 354 (19) 2329-2332 doi:10.1016/j.jnoncrysol.2007.10.048
Smirnov, V., Astakhov, O., Carius, R., Pieters, B. E., Petrusenko, Yu., Borysenko, V., Finger, F. (2012) Performance of p- and n-side illuminated microcrystalline silicon solar cells following 2 MeV electron bombardment. Applied Physics Letters, 101 (14). 143903pp. doi:10.1063/1.4756907
Xiao, Lihong, Astakhov, Oleksandr, Finger, Friedhelm, Stutzmann, Martin (2012) Determination of the defect density in thin film amorphous and microcrystalline silicon from ESR measurements: The influence of the sample preparation procedure. Journal of Non-Crystalline Solids, 358 (17) 2078-2081 doi:10.1016/j.jnoncrysol.2012.01.039
Pomaska, Manuel, Köhler, Florian, Zastrow, Uwe, Mock, Jan, Pennartz, Frank, Muthmann, Stefan, Astakhov, Oleksandr, Carius, Reinhard, Finger, Friedhelm, Ding, Kaining (2016) New insight into the microstructure and doping of unintentionally n-type microcrystalline silicon carbide. Journal of Applied Physics, 119 (17). 175303pp. doi:10.1063/1.4948479
Petrusenko, Yuri, Bakai, Alexander, Borysenko, Valeriy, Astakhov, Aleksandr, Barankov, Dmitro (2009) Investigation of bulk metallic glass structure by means of electron irradiation. Intermetallics, 17 (4). 246-248 doi:10.1016/j.intermet.2008.09.015
 
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