| Reference Type | Journal (article/letter/editorial) |
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| Title | Energetics and valence-band offset of theCaF2/Si insulator-on-semiconductor interface |
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| Journal | Physical Review B |
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| Authors | Satpathy, Sashi | Author |
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| Martin, Richard M. | Author |
| Year | 1989 (April 15) | Volume | 39 |
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| Issue | 12 |
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| Publisher | American Physical Society (APS) |
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| DOI | doi:10.1103/physrevb.39.8494Search in ResearchGate |
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| Generate Citation Formats |
| Mindat Ref. ID | 14101625 | Long-form Identifier | mindat:1:5:14101625:4 |
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| GUID | 0 |
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| Full Reference | Satpathy, Sashi, Martin, Richard M. (1989) Energetics and valence-band offset of theCaF2/Si insulator-on-semiconductor interface. Physical Review B, 39 (12) 8494-8498 doi:10.1103/physrevb.39.8494 |
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| Plain Text | Satpathy, Sashi, Martin, Richard M. (1989) Energetics and valence-band offset of theCaF2/Si insulator-on-semiconductor interface. Physical Review B, 39 (12) 8494-8498 doi:10.1103/physrevb.39.8494 |
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| In | (1989, April) Physical Review B Vol. 39 (12) American Physical Society (APS) |
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