Wirth, Richard (2004) Focused Ion Beam (FIB): A novel technology for advanced application of micro- and nanoanalysis in geosciences and applied mineralogy. European Journal of Mineralogy, 16 (6) 863-876 doi:10.1127/0935-1221/2004/0016-0863
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Focused Ion Beam (FIB): A novel technology for advanced application of micro- and nanoanalysis in geosciences and applied mineralogy | ||
Journal | European Journal of Mineralogy | ||
Authors | Wirth, Richard | Author | |
Year | 2004 (December 28) | Volume | 16 |
Page(s) | 863-876 | Issue | 6 |
Publisher | Schweizerbart | ||
DOI | doi:10.1127/0935-1221/2004/0016-0863Search in ResearchGate | ||
Mindat Ref. ID | 128394 | Long-form Identifier | mindat:1:5:128394:9 |
GUID | ede820e7-403b-4f5e-832f-586397819503 | ||
Full Reference | Wirth, Richard (2004) Focused Ion Beam (FIB): A novel technology for advanced application of micro- and nanoanalysis in geosciences and applied mineralogy. European Journal of Mineralogy, 16 (6) 863-876 doi:10.1127/0935-1221/2004/0016-0863 | ||
Plain Text | Wirth, Richard (2004) Focused Ion Beam (FIB): A novel technology for advanced application of micro- and nanoanalysis in geosciences and applied mineralogy. European Journal of Mineralogy, 16 (6) 863-876 doi:10.1127/0935-1221/2004/0016-0863 | ||
In | (2004, December) European Journal of Mineralogy Vol. 16 (6) Schweizerbart |
See Also
These are possibly similar items as determined by title/reference text matching only.