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Adam, Pierre-Michel, Royer, Pascal, Laddada, Reda, Bijeon, Jean-Louis (1998) Apertureless near-field optical microscopy: influence of the illumination conditions on the image contrast. Applied Optics, 37. 1814pp. doi:10.1364/ao.37.001814

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Reference TypeJournal (article/letter/editorial)
TitleApertureless near-field optical microscopy: influence of the illumination conditions on the image contrast
JournalApplied Optics
AuthorsAdam, Pierre-MichelAuthor
Royer, PascalAuthor
Laddada, RedaAuthor
Bijeon, Jean-LouisAuthor
Year1998 (April 1)Volume37
PublisherThe Optical Society
DOIdoi:10.1364/ao.37.001814Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID11957782Long-form Identifiermindat:1:5:11957782:4
GUID0
Full ReferenceAdam, Pierre-Michel, Royer, Pascal, Laddada, Reda, Bijeon, Jean-Louis (1998) Apertureless near-field optical microscopy: influence of the illumination conditions on the image contrast. Applied Optics, 37. 1814pp. doi:10.1364/ao.37.001814
Plain TextAdam, Pierre-Michel, Royer, Pascal, Laddada, Reda, Bijeon, Jean-Louis (1998) Apertureless near-field optical microscopy: influence of the illumination conditions on the image contrast. Applied Optics, 37. 1814pp. doi:10.1364/ao.37.001814
In(n.d.) Applied Optics Vol. 37. The Optical Society

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Adam, P.M., Royer, P., Laddada, R., Bijeon, J.L. (1998) Polarization contrast with an apertureless near-field optical microscope. Ultramicroscopy, 71 (1). 327-331 doi:10.1016/s0304-3991(97)00091-0
Benrezzak, Sakina, Adam, Pierre Michel, Bijeon, Jean Louis, Royer, Pascal (2001) Observation of nanometric metallic particles with an apertureless scanning near-field optical microscope. Surface Science, 491 (1). 195-207 doi:10.1016/s0039-6028(01)01404-2
Laddada, R., Benrezzak, S., Adam, P. M., Viardot, G., Bijeon, J. L., Royer, P. (1999) Detection of an evanescent field scattered by silicon tips in an apertureless scanning near-field optical microscope. The European Physical Journal Applied Physics, 6 (2). 171-178 doi:10.1051/epjap:1999168
Bergossi, O., Bachelot, R., Wioland, H., Wurtz, G., Laddada, R., Adam, P.M., Bijeon, J.L., Royer, P. (1998) Near Field Optical Microscopy and Spectroscopy with STM and AFM Probes. Acta Physica Polonica A, 93 (2). 393-398 doi:10.12693/aphyspola.93.393
Azoulay, Joël, Débarre, Anne, Richard, Alain, Tchénio, Paul (2000) Optical contrast in apertureless microscopy. Applied Optics, 39. 129pp. doi:10.1364/ao.39.000129
Akil-Jradi, Suzanna, Jradi, Safi, Plain, Jérôme, Adam, Pierre-Michel, Bijeon, Jean-Louis, Royer, Pascal, Bachelot, Renaud (2012) Micro/nanoporous polymer chips as templates for highly sensitive SERS sensors. RSC Advances, 2 (20). 7837pp. doi:10.1039/c2ra21186f
Adam, P.-M., Benrezzak, S., Bijeon, J. L., Royer, P. (2000) Localized surface plasmons on nanometric gold particles observed with an apertureless scanning near-field optical microscope. Journal of Applied Physics, 88 (11). 6919-6921 doi:10.1063/1.1323528
Bachelot, R., Gleyzes, P., Boccara, A. C. (1997) Reflection-mode scanning near-field optical microscopy using an apertureless metallic tip. Applied Optics, 36. 2160pp. doi:10.1364/ao.36.002160
Girard, Christian, Spajer, Michel (1990) Model for reflection near field optical microscopy. Applied Optics, 29. 3726pp. doi:10.1364/ao.29.003726
Walford, J. N., Porto, J. A., Carminati, R., Greffet, J.-J., Adam, P. M., Hudlet, S., Bijeon, J.-L., Stashkevich, A., Royer, P. (2001) Influence of tip modulation on image formation in scanning near-field optical microscopy. Journal of Applied Physics, 89 (9). 5159-5169 doi:10.1063/1.1359153
Bachelot, Renaud, H’Dhili, Fekhra, Barchiesi, Dominique, Lerondel, Gilles, Fikri, Radouane, Royer, Pascal, Landraud, Nathalie, Peretti, Jacques, Chaput, Frédéric, Lampel, Georges, Boilot, Jean-Pierre, Lahlil, Khalid (2003) Apertureless near-field optical microscopy: A study of the local tip field enhancement using photosensitive azobenzene-containing films. Journal of Applied Physics, 94 (3). 2060-2072 doi:10.1063/1.1585117
 
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