| Reference Type | Journal (article/letter/editorial) |
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| Title | Uncertainty Evaluation of SEM-Based Nanoroughness Measurement |
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| Journal | Advanced Materials Research |
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| Authors | Zhao, Feng Xia | Author |
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| Wang, Qing Hai | Author |
| Zhang, Lin Na | Author |
| Zheng, Peng | Author |
| Year | 2012 (February) | Volume | 472 |
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| Publisher | Trans Tech Publications, Ltd. |
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| DOI | doi:10.4028/www.scientific.net/amr.472-475.1319Search in ResearchGate |
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| Generate Citation Formats |
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| Mindat Ref. ID | 11676743 | Long-form Identifier | mindat:1:5:11676743:3 |
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|
| GUID | 0 |
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| Full Reference | Zhao, Feng Xia, Wang, Qing Hai, Zhang, Lin Na, Zheng, Peng (2012) Uncertainty Evaluation of SEM-Based Nanoroughness Measurement. Advanced Materials Research, 472. 1319-1322 doi:10.4028/www.scientific.net/amr.472-475.1319 |
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| Plain Text | Zhao, Feng Xia, Wang, Qing Hai, Zhang, Lin Na, Zheng, Peng (2012) Uncertainty Evaluation of SEM-Based Nanoroughness Measurement. Advanced Materials Research, 472. 1319-1322 doi:10.4028/www.scientific.net/amr.472-475.1319 |
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| In | (n.d.) Advanced Materials Research Vol. 472. Trans Tech Publications, Ltd. |
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