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Chen, Hai Bin, Ge, Nan, Tong, Xiao Jun (2011) Research on the Confidence Interval of Indirect Detection. Advanced Materials Research, 418. 532-535 doi:10.4028/www.scientific.net/amr.418-420.532

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Reference TypeJournal (article/letter/editorial)
TitleResearch on the Confidence Interval of Indirect Detection
JournalAdvanced Materials Research
AuthorsChen, Hai BinAuthor
Ge, NanAuthor
Tong, Xiao JunAuthor
Year2011 (December)Volume418
PublisherTrans Tech Publications, Ltd.
DOIdoi:10.4028/www.scientific.net/amr.418-420.532Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID11667017Long-form Identifiermindat:1:5:11667017:7
GUID0
Full ReferenceChen, Hai Bin, Ge, Nan, Tong, Xiao Jun (2011) Research on the Confidence Interval of Indirect Detection. Advanced Materials Research, 418. 532-535 doi:10.4028/www.scientific.net/amr.418-420.532
Plain TextChen, Hai Bin, Ge, Nan, Tong, Xiao Jun (2011) Research on the Confidence Interval of Indirect Detection. Advanced Materials Research, 418. 532-535 doi:10.4028/www.scientific.net/amr.418-420.532
In(n.d.) Advanced Materials Research Vol. 418. Trans Tech Publications, Ltd.

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(2011) Advanced Materials Research, 418. Trans Tech Publications, Ltd. doi:10.4028/www.scientific.net/amr.418-420
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