| Reference Type | Journal (article/letter/editorial) |
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| Title | A curved vacuum deposited thin film sample holder for Seemann-Bohlin diffractometer |
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| Journal | Zeitschrift für Kristallographie - Crystalline Materials |
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| Authors | Banerjee, R. L. | Author |
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| Richard, A. | Author |
| Year | 1994 (January 1) | Volume | 209 |
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| Issue | 6 |
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| Publisher | Walter de Gruyter GmbH |
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| DOI | doi:10.1524/zkri.1994.209.6.539Search in ResearchGate |
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| Generate Citation Formats |
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| Mindat Ref. ID | 114394 | Long-form Identifier | mindat:1:5:114394:6 |
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| GUID | 0 |
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| Full Reference | Banerjee, R. L., Richard, A. (1994) A curved vacuum deposited thin film sample holder for Seemann-Bohlin diffractometer. Zeitschrift für Kristallographie - Crystalline Materials, 209 (6) 539 doi:10.1524/zkri.1994.209.6.539 |
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| Plain Text | Banerjee, R. L., Richard, A. (1994) A curved vacuum deposited thin film sample holder for Seemann-Bohlin diffractometer. Zeitschrift für Kristallographie - Crystalline Materials, 209 (6) 539 doi:10.1524/zkri.1994.209.6.539 |
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| In | (1994, January) Zeitschrift für Kristallographie - Crystalline Materials Vol. 209 (6) Walter de Gruyter GmbH |
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| Abstract/Notes | AbstractA sample holder is designed and constructed for the Seemann-Bohlin diffractometer obtained by converting a Siemens horizontal X-ray diffractometer with the help of a mechanical linkage. This sample holder allows one to use a vacuum deposited thin film sample, curved to a radius of curvature equal to that of the diffraction circle. It is found that using a curved sample instead of a flat one increases the peak intensity by about 20% and reduces the profile broadening, measured at half its maximum intensity, from (0.85 ± 0.10)° 4 |
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