| Reference Type | Journal (article/letter/editorial) |
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| Title | Characterization of lattice defects by means of a double crystal diffractometer |
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| Journal | Zeitschrift für Kristallographie - Crystalline Materials |
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| Authors | Fiedler, W. | Author |
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| Zhenhong, Mai | Author |
| Year | 1986 (January 1) | Volume | 175 |
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| Issue | 3-4 |
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| Publisher | Walter de Gruyter GmbH |
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| DOI | doi:10.1524/zkri.1986.175.3-4.257Search in ResearchGate |
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| Generate Citation Formats |
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| Mindat Ref. ID | 111148 | Long-form Identifier | mindat:1:5:111148:8 |
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| GUID | 0 |
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| Full Reference | Fiedler, W., Zhenhong, Mai (1986) Characterization of lattice defects by means of a double crystal diffractometer. Zeitschrift für Kristallographie - Crystalline Materials, 175 (3-4) 257 doi:10.1524/zkri.1986.175.3-4.257 |
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| Plain Text | Fiedler, W., Zhenhong, Mai (1986) Characterization of lattice defects by means of a double crystal diffractometer. Zeitschrift für Kristallographie - Crystalline Materials, 175 (3-4) 257 doi:10.1524/zkri.1986.175.3-4.257 |
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| In | (1986, January) Zeitschrift für Kristallographie - Crystalline Materials Vol. 175 (3-4) Walter de Gruyter GmbH |
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| Abstract/Notes | AbstractSilicon crystals grown in a hydrogen atmosphere were heattreated at different temperatures. With the aid of a double-crystal diffractometer rocking curves of the specimen were recorded. Only the sample heat-treated at 1000°C showed significant diffuse scattering due to clustering of hydrogen. The mean cluster radius was determined. |
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