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(1960) Reflexion electron microscopy using diffracted electrons. British Journal of Applied Physics, 11 (4) 158-162 doi:10.1088/0508-3443/11/4/304

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Reference TypeJournal (article/letter/editorial)
TitleReflexion electron microscopy using diffracted electrons
JournalBritish Journal of Applied Physics
Year1960 (April)Volume11
Issue4
PublisherIOP Publishing
DOIdoi:10.1088/0508-3443/11/4/304
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Mindat Ref. ID10690949Long-form Identifiermindat:1:5:10690949:2
GUID0
Full Reference(1960) Reflexion electron microscopy using diffracted electrons. British Journal of Applied Physics, 11 (4) 158-162 doi:10.1088/0508-3443/11/4/304
Plain Text(1960) Reflexion electron microscopy using diffracted electrons. British Journal of Applied Physics, 11 (4) 158-162 doi:10.1088/0508-3443/11/4/304
In(1960, April) British Journal of Applied Physics Vol. 11 (4) IOP Publishing

See Also

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(1960) X-ray microscopy of beryllium. British Journal of Applied Physics, 11 (11) 498-503 doi:10.1088/0508-3443/11/11/304
(1960) Summarized proceedings of a conference on electron microscopy - Exeter, July 1959. British Journal of Applied Physics, 11 (1) 22-32 doi:10.1088/0508-3443/11/1/304
(1960) X-ray microbeam study of deformation bands in aluminium. British Journal of Applied Physics, 11 (4) 162-164 doi:10.1088/0508-3443/11/4/305
(1960) Determination of orientation of bismuth single crystals using back-reflexion technique. British Journal of Applied Physics, 11 (6) 229-230 doi:10.1088/0508-3443/11/6/305
(1953) The colouring of diamonds by neutron and electron bombardment. British Journal of Applied Physics, 4 (11) 334-337 doi:10.1088/0508-3443/4/11/304
(1951) Replica techniques in electron microscopy. British Journal of Applied Physics, 2 (1) 8-11 doi:10.1088/0508-3443/2/1/304
(1960) Very high energy ultrasonics. British Journal of Applied Physics, 11 (4) 143-150 doi:10.1088/0508-3443/11/4/302
(1960) Evaporated films of niobium. British Journal of Applied Physics, 11 (7) 304-305 doi:10.1088/0508-3443/11/7/113
(1960) Contact electrification of semiconductors. British Journal of Applied Physics, 11 (8) 324-331 doi:10.1088/0508-3443/11/8/304
(1960) Contrast of electron micrographs. British Journal of Applied Physics, 11 (11) 486-491 doi:10.1088/0508-3443/11/11/302
(1960) Simple rotary dynamic testing machine. British Journal of Applied Physics, 11 (4) 165-167 doi:10.1088/0508-3443/11/4/306
 
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