Kimura, Takashi, Nishida, Kenji, Tanuma, Shigeo (2006) Spatial Resolution of a Wavelength-Dispersive Electron Probe Microanalyzer Equipped with a Thermal Field Emission Gun. Microchimica Acta, 155. 175-178 doi:10.1007/s00604-006-0538-5
Reference Type | Journal (article/letter/editorial) | ||
---|---|---|---|
Title | Spatial Resolution of a Wavelength-Dispersive Electron Probe Microanalyzer Equipped with a Thermal Field Emission Gun | ||
Journal | Microchimica Acta | ||
Authors | Kimura, Takashi | Author | |
Nishida, Kenji | Author | ||
Tanuma, Shigeo | Author | ||
Year | 2006 (September) | Volume | 155 |
Page(s) | 175-178 | ||
Publisher | Springer Science and Business Media LLC | ||
DOI | doi:10.1007/s00604-006-0538-5Search in ResearchGate | ||
Mindat Ref. ID | 10333320 | Long-form Identifier | mindat:1:5:10333320:7 |
GUID | 1b0242cf-d757-4fc3-8021-22c9e8ac3bac | ||
Full Reference | Kimura, Takashi, Nishida, Kenji, Tanuma, Shigeo (2006) Spatial Resolution of a Wavelength-Dispersive Electron Probe Microanalyzer Equipped with a Thermal Field Emission Gun. Microchimica Acta, 155. 175-178 doi:10.1007/s00604-006-0538-5 | ||
Plain Text | Kimura, Takashi, Nishida, Kenji, Tanuma, Shigeo (2006) Spatial Resolution of a Wavelength-Dispersive Electron Probe Microanalyzer Equipped with a Thermal Field Emission Gun. Microchimica Acta, 155. 175-178 doi:10.1007/s00604-006-0538-5 | ||
In | (n.d.) Microchimica Acta Vol. 155. Springer Science and Business Media LLC |
References Listed
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Yamada H, Okumura T, Kimura T, Knoll W (2002) Proc. of ICEM 15th DURBAN, p 343 | |
T Kimura (2003) J Surf Anal 3, 203 | |
ISO14594 (2003) Microbeam analysis – electron probe microanalyzer – guidelines for the determination of experimental | |
Not Yet Imported: - book : 10.1007/978-1-4613-0491-3 If you would like this item imported into the Digital Library, please contact us quoting Book ID 9781461276531 | |
J R A Cleaver (1973) SEM 1, 487 | |
D Joy (1991) Scanning Microsc 5, 329 |
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