Matsui, Teruhisa, Kawarabayashi, Jun, Watanabe, Kenichi, Iguchi, Tetsuo (2008) Evaluation of Single-Electron Transistor as Nanoscale Thermometer for a Cryogenic Radiation Detector. Journal of Nuclear Science and Technology, 45. 73-77 doi:10.1080/00223131.2008.10875980
| Reference Type | Journal (article/letter/editorial) | ||
|---|---|---|---|
| Title | Evaluation of Single-Electron Transistor as Nanoscale Thermometer for a Cryogenic Radiation Detector | ||
| Journal | Journal of Nuclear Science and Technology | ||
| Authors | Matsui, Teruhisa | Author | |
| Kawarabayashi, Jun | Author | ||
| Watanabe, Kenichi | Author | ||
| Iguchi, Tetsuo | Author | ||
| Year | 2008 (September) | Volume | 45 |
| Publisher | Informa UK Limited | ||
| DOI | doi:10.1080/00223131.2008.10875980Search in ResearchGate | ||
| Generate Citation Formats | |||
| Mindat Ref. ID | 10249947 | Long-form Identifier | mindat:1:5:10249947:8 |
| GUID | 0 | ||
| Full Reference | Matsui, Teruhisa, Kawarabayashi, Jun, Watanabe, Kenichi, Iguchi, Tetsuo (2008) Evaluation of Single-Electron Transistor as Nanoscale Thermometer for a Cryogenic Radiation Detector. Journal of Nuclear Science and Technology, 45. 73-77 doi:10.1080/00223131.2008.10875980 | ||
| Plain Text | Matsui, Teruhisa, Kawarabayashi, Jun, Watanabe, Kenichi, Iguchi, Tetsuo (2008) Evaluation of Single-Electron Transistor as Nanoscale Thermometer for a Cryogenic Radiation Detector. Journal of Nuclear Science and Technology, 45. 73-77 doi:10.1080/00223131.2008.10875980 | ||
| In | (n.d.) Journal of Nuclear Science and Technology Vol. 45. Informa UK Limited | ||
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