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Li, Y, Holland, D J (2013) Fast and robust 3D electrical capacitance tomography. Measurement Science and Technology, 24. 105406pp. doi:10.1088/0957-0233/24/10/105406

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Reference TypeJournal (article/letter/editorial)
TitleFast and robust 3D electrical capacitance tomography
JournalMeasurement Science and Technology
AuthorsLi, YAuthor
Holland, D JAuthor
Year2013 (October 1)Volume24
PublisherIOP Publishing
DOIdoi:10.1088/0957-0233/24/10/105406Search in ResearchGate
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Mindat Ref. ID10197099Long-form Identifiermindat:1:5:10197099:2
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Full ReferenceLi, Y, Holland, D J (2013) Fast and robust 3D electrical capacitance tomography. Measurement Science and Technology, 24. 105406pp. doi:10.1088/0957-0233/24/10/105406
Plain TextLi, Y, Holland, D J (2013) Fast and robust 3D electrical capacitance tomography. Measurement Science and Technology, 24. 105406pp. doi:10.1088/0957-0233/24/10/105406
In(n.d.) Measurement Science and Technology Vol. 24. IOP Publishing

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Neumayer, M, Watzenig, D, Zangl, H (2011) AnH∞approach for robust estimation of material parameters in electrical capacitance tomography. Measurement Science and Technology, 22. 104004pp. doi:10.1088/0957-0233/22/10/104004
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