| Reference Type | Journal (article/letter/editorial) |
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| Title | A theoretical treatment of void electromigration in the strip geometry |
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| Journal | Computational Materials Science |
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| Authors | Amar, M.Ben | Author |
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| Cummings, L.J. | Author |
| Richardson, G. | Author |
| Year | 2000 (June) | Volume | 17 |
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| Issue | 2 |
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| Publisher | Elsevier BV |
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| DOI | doi:10.1016/s0927-0256(00)00039-2Search in ResearchGate |
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| Generate Citation Formats |
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| Mindat Ref. ID | 9503166 | Long-form Identifier | mindat:1:5:9503166:6 |
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| GUID | 0 |
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| Full Reference | Amar, M.Ben, Cummings, L.J., Richardson, G. (2000) A theoretical treatment of void electromigration in the strip geometry. Computational Materials Science, 17 (2). 279-289 doi:10.1016/s0927-0256(00)00039-2 |
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| Plain Text | Amar, M.Ben, Cummings, L.J., Richardson, G. (2000) A theoretical treatment of void electromigration in the strip geometry. Computational Materials Science, 17 (2). 279-289 doi:10.1016/s0927-0256(00)00039-2 |
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| In | (2000, June) Computational Materials Science Vol. 17 (2) Elsevier BV |
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