Kim, K. H., Kang, B. S., Lee, M.-J., Ahn, S.-E., Lee, C. B., Stefanovich, G., Xianyu, W. X., Kim, K.-K., Kim, J. S., Yoo, I. K., Park, Y. (2008) Defect-induced degradation of rectification properties of aged Pt∕n-InxZn1−xOy Schottky diodes. Applied Physics Letters, 92 (23). 233507pp. doi:10.1063/1.2942385

See Also

These are possibly similar items as determined by title/reference text matching only.

	Lee, C. B., Kang, B. S., Lee, M. J., Ahn, S. E., Stefanovich, G., Xianyu, W. X., Kim, K. H., Hur, J. H., Yin, H. X., Park, Y., Yoo, I. K., Park, J.-B., Park, B. H. (2007) Electromigration effect of Ni electrodes on the resistive switching characteristics of NiO thin films. Applied Physics Letters, 91 (8). 82104pp. doi:10.1063/1.2769759
	Lee, M. J., Park, Y., Ahn, S. E., Kang, B. S., Lee, C. B., Kim, K. H., Xianyu, W. X., Yoo, I. K., Lee, J. H., Chung, S. J., Kim, Y. H., Lee, C. S., Choi, K. N., Chung, K. S. (2008) Comparative structural and electrical analysis of NiO and Ti doped NiO as materials for resistance random access memory. Journal of Applied Physics, 103 (1). 13706pp. doi:10.1063/1.2829814
	Ahn, S.-E., Lee, M.-J., Park, Y., Kang, B. S., Lee, C. B., Kim, K. H., Seo, S., Suh, D.-S., Kim, D.-C., Hur, J., Xianyu, W., Stefanovich, G., Yin, H., Yoo, I.-K., Lee, J.-H., Park, J.-B., Baek, I.-G., Park, B. H. (2008) Write Current Reduction in Transition Metal Oxide Based Resistance Change Memory. Advanced Materials, 20. 924-928 doi:10.1002/adma.200702081
	Lee, C. B., Kang, B. S., Benayad, A., Lee, M. J., Ahn, S.-E., Kim, K. H., Stefanovich, G., Park, Y., Yoo, I. K. (2008) Effects of metal electrodes on the resistive memory switching property of NiO thin films. Applied Physics Letters, 93 (4). 42115pp. doi:10.1063/1.2967194
	Kim, D. C., Lee, M. J., Ahn, S. E., Seo, S., Park, J. C., Yoo, I. K., Baek, I. G., Kim, H. J., Yim, E. K., Lee, J. E., Park, S. O., Kim, H. S., Chung, U-In, Moon, J. T., Ryu, B. I. (2006) Improvement of resistive memory switching in NiO using IrO2. Applied Physics Letters, 88 (23). 232106pp. doi:10.1063/1.2210087
	Lee, H. K., Lee, K. W., Park, K., Huang, N. M., Oh, O. K., Kim, J. S., Yoo, K. H., Kim, Y. B., Kim, C. S., Cho, Y. K., Park, J. C., Suck, S. I. (1989) Preparation and properties of Pb‐doped Bi‐Sr‐Ca‐Cu‐O superconductors. Journal of Applied Physics, 66 (4). 1881-1883 doi:10.1063/1.344370
	Adhikari, G., Carlin, N., Choi, J. J., Choi, S., Ezeribe, A. C., França, L. E., Ha, C., Hahn, I. S., Hollick, S. J., Jeon, E. J., Jo, J. H., Joo, H. W., Kang, W. G., Kauer, M., Kim, B. H., Kim, H. J., Kim, J., Kim, K. W., Kim, S. H., Kim, S. K., Kim, W. K., Kim, Y. D., Kim, Y. H., Ko, Y. J., Lee, D. H., Lee, E. K., Lee, H., Lee, H. S., Lee, H. Y., Lee, I. S., Lee, J., Lee, J. Y., Lee, M. H., Lee, S. H., Lee, S. M., Lee, Y. J., Leonard, D. S., Luan, N. T., Manzato, B. B., Maruyama, R. H., Neal, R. J., Nikkel, J. A., Olsen, S. L., Park, B. J., Park, H. K., Park, H. S., Park, K. S., Park, S. D., Pitta, R. L. C., Prihtiadi, H., Ra, S. J., Rott, C., Shin, K. A., Cavalcante, D. F. F. S., Scarff, A., Spooner, N. J. C., Thompson, W. G., Yang, L., Yu, G. H., , (2023) Search for Boosted Dark Matter in COSINE-100. Physical Review Letters, 131 (20) doi:10.1103/physrevlett.131.201802
	Ahn, J. K., Chebotaryov, S., Choi, J. H., Choi, S., Choi, W., Choi, Y., Jang, H. I., Jang, J. S., Jeon, E. J., Jeong, I. S., Joo, K. K., Kim, B. R., Kim, B. C., Kim, H. S., Kim, J. Y., Kim, S. B., Kim, S. H., Kim, S. Y., Kim, W., Kim, Y. D., Lee, J., Lee, J. K., Lim, I. T., Ma, K. J., Pac, M. Y., Park, I. G., Park, J. S., Park, K. S., Shin, J. W., Siyeon, K., Yang, B. S., Yeo, I. S., Yi, S. H., Yu, I. (2012) Observation of Reactor Electron Antineutrinos Disappearance in the RENO Experiment. Physical Review Letters, 108 (19). doi:10.1103/physrevlett.108.191802
	Seo, S., Lee, M. J., Kim, D. C., Ahn, S. E., Park, B.-H, Kim, Y. S., Yoo, I. K., Byun, I. S., Hwang, I. R., Kim, S. H., Kim, J.-S., Choi, J. S., Lee, J. H., Jeon, S. H., Hong, S. H., Park, B. H. (2005) Electrode dependence of resistance switching in polycrystalline NiO films. Applied Physics Letters, 87 (26). 263507pp. doi:10.1063/1.2150580
	Seo, Sunae, Yoon, Jong-Gul, Kim, J. D., Song, T. K., Kang, B. S., Noh, T. W., Lee, Y. K., Kim, Ch. J., Lee, I. S., Lee, J. K., Park, Y. S. (2002) Hydrogen-induced degradation in ferroelectric Bi3.25La0.75Ti3O12. Applied Physics Letters, 81 (10). 1857-1859 doi:10.1063/1.1505110
	Adhikari, G., de Souza, E. Barbosa, Carlin, N., Choi, J. J., Choi, S., Djamal, M., Ezeribe, A. C., França, L. E., Ha, C., Hahn, I. S., Jeon, E. J., Jo, J. H., Joo, H. W., Kang, W. G., Kauer, M., Kim, H., Kim, H. J., Kim, K. W., Kim, S. H., Kim, S. K., Kim, W. K., Kim, Y. D., Kim, Y. H., Ko, Y. J., Lee, E. K., Lee, H., Lee, H. S., Lee, H. Y., Lee, I. S., Lee, J., Lee, J. Y., Lee, M. H., Lee, S. H., Lee, S. M., Leonard, D. S., Lynch, W. A., Manzato, B. B., Maruyama, R. H., Neal, R. J., Olsen, S. L., Park, B. J., Park, H. K., Park, H. S., Park, K. S., Pitta, R. L. C., Prihtiadi, H., Ra, S. J., Rott, C., Shin, K. A., Scarff, A., Spooner, N. J. C., Thompson, W. G., Yang, L., Yu, G. H., , (2021) Background modeling for dark matter search with 1.7 years of COSINE-100 data. The European Physical Journal C, 81 (9) doi:10.1140/epjc/s10052-021-09564-0