| Reference Type | Journal (article/letter/editorial) |
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| Title | Uniaxial-stress effects on electronic properties of silicon carbide nanowires |
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| Journal | Applied Physics Letters |
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| Authors | Yan, Binghai | Author |
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| Zhou, Gang | Author |
| Duan, Wenhui | Author |
| Wu, Jian | Author |
| Gu, Bing-Lin | Author |
| Year | 2006 (July 10) | Volume | 89 |
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| Issue | 2 |
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| Publisher | AIP Publishing |
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| DOI | doi:10.1063/1.2221388Search in ResearchGate |
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| Generate Citation Formats |
| Mindat Ref. ID | 8550720 | Long-form Identifier | mindat:1:5:8550720:3 |
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|
| GUID | 0 |
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| Full Reference | Yan, Binghai, Zhou, Gang, Duan, Wenhui, Wu, Jian, Gu, Bing-Lin (2006) Uniaxial-stress effects on electronic properties of silicon carbide nanowires. Applied Physics Letters, 89 (2). 23104pp. doi:10.1063/1.2221388 |
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| Plain Text | Yan, Binghai, Zhou, Gang, Duan, Wenhui, Wu, Jian, Gu, Bing-Lin (2006) Uniaxial-stress effects on electronic properties of silicon carbide nanowires. Applied Physics Letters, 89 (2). 23104pp. doi:10.1063/1.2221388 |
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| In | (2006, July) Applied Physics Letters Vol. 89 (2) AIP Publishing |
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