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Kasouit, S., Kumar, S., Vanderhaghen, R., Roca i Cabarrocas, P., French, I. (2002) Fluorine and hydrogen effects on the growth and transport properties of microcrystalline silicon from SiF4 precursor. Journal of Non-Crystalline Solids, 299. 113-117 doi:10.1016/s0022-3093(01)01187-5

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Reference TypeJournal (article/letter/editorial)
TitleFluorine and hydrogen effects on the growth and transport properties of microcrystalline silicon from SiF4 precursor
JournalJournal of Non-Crystalline Solids
AuthorsKasouit, S.Author
Kumar, S.Author
Vanderhaghen, R.Author
Roca i Cabarrocas, P.Author
French, I.Author
Year2002 (April)Volume299
PublisherElsevier BV
DOIdoi:10.1016/s0022-3093(01)01187-5Search in ResearchGate
Generate Citation Formats
Mindat Ref. ID640359Long-form Identifiermindat:1:5:640359:5
GUID0
Full ReferenceKasouit, S., Kumar, S., Vanderhaghen, R., Roca i Cabarrocas, P., French, I. (2002) Fluorine and hydrogen effects on the growth and transport properties of microcrystalline silicon from SiF4 precursor. Journal of Non-Crystalline Solids, 299. 113-117 doi:10.1016/s0022-3093(01)01187-5
Plain TextKasouit, S., Kumar, S., Vanderhaghen, R., Roca i Cabarrocas, P., French, I. (2002) Fluorine and hydrogen effects on the growth and transport properties of microcrystalline silicon from SiF4 precursor. Journal of Non-Crystalline Solids, 299. 113-117 doi:10.1016/s0022-3093(01)01187-5
In(2002) Journal of Non-Crystalline Solids Vol. 299. Elsevier BV

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Vanderhaghen, R, Kasouit, S, Brenot, R, Chu, V, Conde, J.P, Liu, F, de Martino, A, Roca i Cabarrocas, P (2002) Electronic transport in microcrystalline silicon controlled by trapping and intra-grain mobility. Journal of Non-Crystalline Solids, 299. 365-369 doi:10.1016/s0022-3093(01)00953-x
Kalache, B., Kosarev, A.I., Vanderhaghen, R., Roca i Cabarrocas, P. (2002) Ion bombardment effects on the microcrystalline silicon growth mechanisms and structure. Journal of Non-Crystalline Solids, 299. 63-67 doi:10.1016/s0022-3093(01)00995-4
Ram, Sanjay K., Kumar, Satyendra, Vanderhaghen, Régis, Roca i Cabarrocas, P. (2002) Investigations of the electron transport behavior in microcrystalline Si films. Journal of Non-Crystalline Solids, 299. 411-415 doi:10.1016/s0022-3093(01)00955-3
Kasouit, S., Damon-Lacoste, J., Vanderhaghen, R., Roca i Cabarrocas, P. (2004) Contribution of plasma generated nanocrystals to the growth of microcrystalline silicon thin films. Journal of Non-Crystalline Solids, 338. 86-90 doi:10.1016/j.jnoncrysol.2004.02.027
Vanderhaghen, R., Kasouit, S., Damon-Lacoste, J., Liu, F., Roca i Cabarrocas, P. (2004) Study of transport, trapping and recombination mechanisms in microcrystalline silicon by transient photoconductivity. Journal of Non-Crystalline Solids, 338. 336-340 doi:10.1016/j.jnoncrysol.2004.02.068
Kasouit, S., Roca i Cabarrocas, P., Vanderhaghen, R., Bonnassieux, Y., Elyaakoubi, M., French, I.D. (2004) Effects of grain size and plasma-induced modification of the dielectric on the mobility and stability of bottom gate microcrystalline silicon TFTs. Journal of Non-Crystalline Solids, 338. 369-373 doi:10.1016/j.jnoncrysol.2004.02.076
Liu, F., Zhu, M., Feng, Y., Han, Y., Liu, J., Kasouit, S., Vanderhaghen, R. (2002) Transport mechanism of microcrystalline silicon thin films. Journal of Non-Crystalline Solids, 299. 385-389 doi:10.1016/s0022-3093(02)00915-8
Brenot, R, Vanderhaghen, R, Drévillon, B, Roca i Cabarrocas, P (2000) Measurement of transversal ambipolar diffusion coefficient in microcrystalline silicon. Journal of Non-Crystalline Solids, 266. 336-340 doi:10.1016/s0022-3093(99)00721-8
Fontcuberta i Morral, A, Roca i Cabarrocas, P (2002) Etching and hydrogen diffusion mechanisms during a hydrogen plasma treatment of silicon thin films. Journal of Non-Crystalline Solids, 299. 196-200 doi:10.1016/s0022-3093(01)01001-8
Bronner, W, Kleider, J.P, Brüggemann, R, Roca i Cabarrocas, P, Mencaraglia, D, Mehring, M (2002) Comparison of transport and defects properties in hydrogenated polymorphous and amorphous silicon. Journal of Non-Crystalline Solids, 299. 551-555 doi:10.1016/s0022-3093(01)01201-7
Brenot, R, Bulkin, P, Roca i Cabarrocas, P, Drévillon, B, Vanderhaghen, R (1998) In situ characterization of microcrystalline silicon by time resolved microwave conductivity. Journal of Non-Crystalline Solids, 227. 1001-1005 doi:10.1016/s0022-3093(98)00320-2
 
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