| Reference Type | Journal (article/letter/editorial) |
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| Title | Atomic structure of the nanocrystalline Si particles appearing in nanostructured Si thin films produced in low-temperature radiofrequency plasmas |
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| Journal | Journal of Applied Physics |
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| Authors | Viera, G. | Author |
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| Mikikian, M. | Author |
| Bertran, E. | Author |
| Cabarrocas, P. Roca i | Author |
| Boufendi, L. | Author |
| Year | 2002 (October 15) | Volume | 92 |
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| Issue | 8 |
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| Publisher | AIP Publishing |
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| DOI | doi:10.1063/1.1506382Search in ResearchGate |
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| Generate Citation Formats |
| Mindat Ref. ID | 5117075 | Long-form Identifier | mindat:1:5:5117075:8 |
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| GUID | 0 |
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| Full Reference | Viera, G., Mikikian, M., Bertran, E., Cabarrocas, P. Roca i, Boufendi, L. (2002) Atomic structure of the nanocrystalline Si particles appearing in nanostructured Si thin films produced in low-temperature radiofrequency plasmas. Journal of Applied Physics, 92 (8). 4684-4694 doi:10.1063/1.1506382 |
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| Plain Text | Viera, G., Mikikian, M., Bertran, E., Cabarrocas, P. Roca i, Boufendi, L. (2002) Atomic structure of the nanocrystalline Si particles appearing in nanostructured Si thin films produced in low-temperature radiofrequency plasmas. Journal of Applied Physics, 92 (8). 4684-4694 doi:10.1063/1.1506382 |
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| In | (2002, October) Journal of Applied Physics Vol. 92 (8) AIP Publishing |
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